검색어 : 통합검색[Digital integrated circuits.]
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911
- Nondestructive Testing of Train Wheels Using Vertical Magnetization and Differential-Type Hall-Sensor Array
- Jinyi Lee; Myoungki Choi; Jongwoo Jun; Seokjin Kwon; Joo-Hyung Kim; Jungmin Kim; Minhhuy Le; Dept. of Control, Chosun Univ., Gwangju, South Korea; Grad. Sch., Dept. of Inf. & Commun. Eng., Chosun Univ., Gwangju, South Korea; Res. Center for Real Time NDT, Chosun Univ., Gwangju, South Korea; Korea Railroad Res. Inst., Uiwang, South Korea; Dept. of Electron. Eng., Chosun Univ., Gwangju, South Korea; Dept. of Control & Instrum. Eng., Chosun Univ., Gwangju, South Korea; Dept. of Control & Instrum. Eng., Chosun Univ., Gwangju, South Korea; (IEEE transactions on instrumentation and measurement, v.61, 2012, pp.2346-2353)
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912
- Proton irradiation effects on advanced digital and microwave III-V components
- Hash, G.L.; Schwanck, J.R.; Shaneyfelt, M.R.; Sandoval, C.E.; Conners, M.P.; Sheridan, T.J.; Sexton, F.W.; Slayton, E.M.; Heise, J.A.; Foster, C.C.; Sandia National Laboratories, Albuquerque, NM, USA; Sandia Nat. Labs., Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Sandia Nat. Labs., Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Sandia National Laboratories, Albuquerque, NM, USA; Indiana University Cyclotron Facility, Bloomington, IN, USA; (IEEE transactions on nuclear science, v.41, 1994, pp.2259-2266)
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913
- IEE East Midland Centre: Chairman's address. Some theoretical aspects of combinatorial logic: or how to do it with chips
- Pollard, J.R.; ; (IEE Proceedings A, Physical science, measurement and instrumentation, management and education - reviews, v.128, 1981, pp.138-139)
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914
- Photogrammetric satellite service prediction - Correlation of RF measurements and image data
- Ihlow, Alexander; Arndt, Daniel; Topf, Felix; Rothaug, Christoph; Wittenberg, Thomas; Heuberger, Albert; ; (Broadband Multimedia Systems and Broadcasting (BMSB), 2011 IEEE International Symposium on, v.2011, 2011, pp.1-6)
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915
- 24-bit digital accelerometers
- Lally, Richard; Oceana Sensor Technologies, 1632 Corporate Landing Pkwy., Virginia Beach, VA 23454; (The Journal of the Acoustical Society of America, v.101, 1997, pp.3044-3044)
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916
- EIN ALGORITHMUS ZUR BERECHNUNG VON TESTS FUER DIGITALE FUNKTIONSGRUPPEN. left bracket Algorithm for Computing Tests for Digital Functional Group right bracket
- Eckert, Klaus; Richter, Berndt; ; (Zeitschrift für elektrische Informations- und Energietechnik, v.7, 1977, pp.521-528)
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917
- Timing characterization and constraining tool
- Amrozik, P.; Napieralski, A.; ; (Microelectronics journal, v.45, 2014, pp.311-324)
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918
- FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs
- Zhang, Jin; Liu, Zhenghui; Hu, Xiao; Liu, Peixin; Hu, Zhiling; Kuang, Lidan; School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha 410076, China; School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha 410076, China; College of Computer Science and Technology, National University of Defense Technology, Changsha 410073, China; College of Computer Science and Technology, National University of Defense Technology, Changsha 410073, China; College of Computer Science and Technology, National University of Defense Technology, Changsha 410073, China; School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha 410076, China; (Electronics, v.13, 2024, pp.1667)
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919
- Envelope and phase path recombination in ADPLL-based wideband polar transmitters
- Syllaios, I.L.; Balsara, P.T.; Staszewski, R.B.; ; (Circuits and Systems Workshop: System-on-Chip - Design, Applications, Integration, and Software, 2008 IEEE Dallas, v.2008, 2008, pp.1-4)
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920
- Efficient algorithms for multilevel power estimation of VLSI circuits
- Bachmann, W.W.; Huss, S.A.; Darmstadt Univ. of Technol.; (IEEE transactions on very large scale integration (VLSI) systems, v.13, 2005, pp.238-254)
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