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- 5.2. Extracts from SPX Nos. 300-302
- ; ; (COSPAR information bulletin, v.1979, 1979, pp.103-106)
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72
- Er:Y2SiO5 Eyesafe Laser at 300 K
- Spariosu, K.; Stultz, R. D.; Camargo, M. B.; Montgomery, S.; Birnbaum, M.; Chai, B. H. T.; ; (Advanced Solid State Lasers, v.2004, 2004, pp.EL3)
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73
- Low wavenumberRaman bands (300?50cm?1) for four isotopically substituted lithium hydrogen oxalate monohydrates LiXC2O4�X 2O
- Hase, Yoshiyuki; ; (Monatshefte für Chemie = Chemical monthly, v.114, 1983, pp.541-546)
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74
- Chaleur specifique de 35 a 300 K du sesquicarbure de plutonium Pu2C3
- Danan, J.; ; (Journal of nuclear materials = Journal des matériaux nucléaires, v.45, 1973, pp.339-340)
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75
- [A case from practice (195). Panic disorder without agoraphobia, DSM-III-R-(2) 300.01]
- Csontos, I; ; (Schweizerische Rundschau für Medizin Praxis : Revue suisse de médicine Praxis, v.79, 1990, pp.1347-1348)
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76
- Silicon bipolar 6.2G Hz 300mW frequency dividers
- Onodera, K.; Sawairi, A.; Hara, Y.; Kusama, N.; ; (Solid-State Circuits Conference. Digest of Technical Papers. 1985 IEEE International, v.1985, 1985, pp.216-217)
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77
- Cryostat for Thermal Measurements between 2-300°K
- Bigeleisen, J.; Brooks, F. P.; Ishida, T.; Ribnikar, S. V.; Chemistry and Accelerator Departments, Brookhaven National Laboratory, Upton, L. I., New York 11973; Chemistry and Accelerator Departments, Brookhaven National Laboratory, Upton, L. I., New York 11973; Chemistry and Accelerator Departments, Brookhaven National Laboratory, Upton, L. I., New York 11973; Chemistry and Accelerator Departments, Brookhaven National Laboratory, Upton, L. I., New York 11973; (Review of scientific instruments, v.39, 1968, pp.353-356)
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78
- A 200–300 GHz 1:2 Active power divider MMIC
- Muller, D.; Fink, M.; Eisenbeis, J.; Massler, H.; Tessmann, A.; Leuther, A.; Zwick, T.; Kallfass, I.; Institute of Radio Frequency Engineering and Electronics, Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany; Institute of Radio Frequency Engineering and Electronics, Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany; Institute of Radio Frequency Engineering and Electronics, Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany; Eraunhofer Institute for Applied Solid State Physics, 79108 Freiburg, Germany; Eraunhofer Institute for Applied Solid State Physics, 79108 Freiburg, Germany; Eraunhofer Institute for Applied Solid State Physics, 79108 Freiburg, Germany; Institute of Radio Frequency Engineering and Electronics, Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany; Institute of Robust Power Semiconductor Systems, University of Stuttgart, 70569 Stuttgart, Germany; (Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2017 42nd International Conference on, v.2017, 2017, pp.1-2)
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79
- WS<sub>2</sub> transistors on 300 mm wafers with BEOL compatibility
- Schram, T.; Smets, Q.; Groven, B.; Heyne, M. H.; Kunnen, E.; Thiam, A.; Devriendt, K.; Delabie, A.; Lin, D.; Lux, M.; Chiappe, D.; Asselberghs, I.; Brus, S.; Huyghebaert, C.; Sayan, S.; Juncker, A.; Caymax, M.; Radu, I. P.; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; COVENTOR, 3, Avenue du Quebec, 91140 Villebon sur Yvette, France; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; IMEC, kapeldreef 75, B-3001 Leuven, Belgium; (Solid-State Device Research Conference (ESSDERC), 2017 47th European, v.2017, 2017, pp.212-215)
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80
- Electrochemical formation of Ag<SUB><I>x</I></SUB>TiS<SUB>2</SUB> at 300 K
- Schramke, Jochen; Schö llhorn, Robert; ; (Solid state ionics, v.23, 1987, pp.197-202)
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