검색어 : 통합검색[Digital integrated circuits.]
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61
- Some design problems of integrated digital circuits
- Benny, AH; Evans, CS; Ferranti Limited, CS; ; (Vacuum, v.15, 1965, pp.465-465)
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62
- FUTURE IMPACT OF GaAs DIGITAL INTEGRATED CIRCUITS
- Greiling, P. T.; Krumm, C. F.; ; (VLSI Electronics, Microstructure Science, v.11, 1985, pp.133-171)
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63
- Computer-Aided Analysis of RFI Effects in Digital Integrated Circuits
- Whalen, James J.; Tront, Joseoh G.; Larson, Curtis E.; Roe, James M.; Department of Electrical Engineering, State University at Buffalo, Amherst, NY 14226. (716)831-1835; Department of Electrical Engineering, State University at Buffalo, Amherst, NY 14226. (716)831-1835; Electromagnetic Compatibility Department, McDonnell Douglas Astronautics Company, St. Louis, MO 63166. (314)232-3902; Electromagnetic Compatibility Department, McDonnell Douglas Astronautics Company, St. Louis, MO 63166. (314)232-3902; (IEEE transactions on electromagnetic compatibility, v.emc21, 1979, pp.291-297)
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64
- User's guidebook to digital CMOS integrated circuits
- Shiva, S.G.; University of Alabama in Huntsville, Huntsville, AL; (Proceedings of the IEEE, v.71, 1983, pp.686-687)
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65
- Built-in test for complex digital integrated circuits
- ; ; (Microelectronics journal, v.12, 1981, pp.43)
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66
- Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits
- Jess, J.A.G.; Kalafala, K.; Naidu, S.R.; Otten, R.H.J.M.; Visweswariah, C.; Dept. of Electr. Eng., Eindhoven Univ. of Technol.; (IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society, v.25, 2006, pp.2376-2392)
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67
- Online Timing Variation Tolerance for Digital Integrated Circuits
- Yan, G.; Li, X.; ; (Proceedings : International Test Conference, v.2011, 2011, pp.82-91)
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68
- Digital integrated circuits analysis and design - Book Reviews
- Newcomb, R.W.; ; (IEEE circuits and systems magazine, v.4, 2004, pp.34-40)
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69
- IEC COMPLETES WORLD STANDARD FOR DIGITAL INTEGRATED CIRCUITS :
- ; ; (Biomedical safety & standards, v.16, 1986, pp.51)
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70
- Built-in test for complex digital integrated circuits
- Konemann, B.; Zwiehoff, G.; Mucha, J.; ; (IEEE journal of solid-state circuits, v.15, 1980, pp.315-319)
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