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  • 21
    Biological Characterisation of Superficial Bladder Cancer by Bivariate Cytokeratin 7/DNA Analysis, Flow Cytometric Assessment of MIB-1, and an Immunohistochemical Study
    Leonardi Elena; Palma Paolo Dalla; Reich Alessandro; Caffo Orazio; Luciani Lucio; Department of Pathology, St. Chiara Hospital, Trento, Italy; Department of Pathology, St. Chiara Hospital, Trento, Italy; Department of Urology, St. Chiara Hospital, Trento, Italy; Department of Oncology, St. Chiara Hospital, Trento, Italy; Department of Urology, St. Chiara Hospital, Trento, Italy; (Analytical Cellular Pathology, v.21, 2000, pp.21-33)
  • 22
    Cross-talk characterization of dense single-photon avalanche diode arrays in CMOS 150-nm technology
    Xu, Hesong; Pancheri, Lucio; C. Braga, Leo H.; Betta, Gian-Franco Dalla; Stoppa, David; Fondazione Bruno Kessler, Integrated Radiation and Image Sensors Division, Via Sommarive 18, Trento 38123, ItalybUniversity of Trento, Department of Industrial Engineering, Via Sommarive 5, Trento 38123, Italy; University of Trento, Department of Industrial Engineering, Via Sommarive 5, Trento 38123, Italy; Fondazione Bruno Kessler, Integrated Radiation and Image Sensors Division, Via Sommarive 18, Trento 38123, Italy; University of Trento, Department of Industrial Engineering, Via Sommarive 5, Trento 38123, Italy; Fondazione Bruno Kessler, Integrated Radiation and Image Sensors Division, Via Sommarive 18, Trento 38123, ItalybUniversity of Trento, Department of Industrial Engineering, Via Sommarive 5, Trento 38123, Italy; (Optical engineering : the journal of the Society of Photo-optical Instrumentation Engineers, v.55, 2016, pp.067102)
  • 23
    Real‐Time Optical Response of Polysiloxane/Quantum Dot Nanocomposites under 2 MeV Proton Irradiation: Luminescence Enhancement of Polysiloxane Emission through Quantum Dot Sensitization
    Zanazzi, Enrico; Favaro, Matteo; Ficorella, Andrea; Pancheri, Lucio; Dalla Betta, Gian Franco; Quaranta, Alberto; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; Department of Industrial Engineering University of Trento Via Sommarive 9 I-38123 Povo, Trento Italy; (Physica status solidi. PSS. A, Applications and materials science, v.217, 2020, pp.1900586)
  • 24
    A single-photon avalanche diode test chip in 150nm CMOS technology
    Pancheri, Lucio; Dalla Betta, Gian-Franco; Huf Campos Braga, Leo; Hesong Xu; Stoppa, David; ; (Microelectronic Test Structures (ICMTS), 2014 International Conference on, v.2014, 2014, pp.161-164)
  • 25
    A 180-nm CMOS time-of-flight 3-D image sensor
    Dalla Betta, Gian-Franco; Donati, Silvano; Martini, Giuseppe; Pancheri, Lucio; Stoppa, David; Verzellesi, Giovanni; ; (Information Optics (WIO), 2010 9th Euro-American Workshop on, v.2010, 2010, pp.1-3)
  • 26
    Fully Depleted Monolithic Active Microstrip Sensors: TCAD Simulation Study of an Innovative Design Concept
    De Cilladi, Lorenzo; Corradino, Thomas; Dalla Betta, Gian-Franco; Neubü ser, Coralie; Pancheri, Lucio; Dipartimento di Fisica, Università degli Studi di Torino, 10125 Torino, Italy; Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; thomas.corradino@unitn.it (T.C.); gianfranco.dallabetta@unitn.it (G.-F.D.B.); lucio.pancheri@unitn.it (L.P.); Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; thomas.corradino@unitn.it (T.C.); gianfranco.dallabetta@unitn.it (G.-F.D.B.); lucio.pancheri@unitn.it (L.P.); Trento Institute for Fundamental Physics and Applications— Istituto Nazionale di Fisica Nucleare (TIFPA-INFN), 38123 Trento, Italy; coralie.neubueser@tifpa.infn.it; Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; thomas.corradino@unitn.it (T.C.); gianfranco.dallabetta@unitn.it (G.-; (Sensors, v.21, 2021, pp.1990)
  • 27
    Design and Characterization of Backside Termination Structures for Thick Fully-Depleted MAPS
    Corradino, Thomas; Dalla Betta, Gian-Franco; De Cilladi, Lorenzo; Neubü ser, Coralie; Pancheri, Lucio; Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; gianfranco.dallabetta@unitn.it (G.-F.D.B.); lucio.pancheri@unitn.it (L.P.); Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; gianfranco.dallabetta@unitn.it (G.-F.D.B.); lucio.pancheri@unitn.it (L.P.); Dipartimento di Fisica, Università degli Studi di Torino, 10125 Torino, Italy; lorenzo.decilladi@unito.it; Trento Institute for Fundamental Physics and Applications-Istituto Nazionale di Fisica Nucleare (TIFPA-INFN), 38123 Trento, Italy; coralie.neubueser@tifpa.infn.it; Dipartimento di Ingegneria Industriale, Università degli Studi di Trento, 38123 Trento, Italy; gianfranco.dallabetta@unitn.it (G.-F.D.B.); lucio.pancheri@unitn.it (L.P.); (Sensors, v.21, 2021, pp.3809)
  • 28
    A hybrid CMOS-imager with a solution-processable polymer as photoactive layer
    Baierl, Daniela; Pancheri, Lucio; Schmidt, Morten; Stoppa, David; Dalla Betta, Gian-Franco; Scarpa, Giuseppe; Lugli, Paolo; Institute for Nanoelectronics, Technische Universit채t M체nchen, 80333 Munich, Germany.; Fondazione Bruno Kessler, 38123 Trento, Italy.; Institute for Nanoelectronics, Technische Universit채t M체nchen, 80333 Munich, Germany.; Fondazione Bruno Kessler, 38123 Trento, Italy.; Department of Information Engineering and Computer Science, University of Trento, 38123 Trento, Italy.; Institute for Nanoelectronics, Technische Universit채t M체nchen, 80333 Munich, Germany.; Institute for Nanoelectronics, Technische Universit채t M체nchen, 80333 Munich, Germany.; (Nature communications, v.3, 2012, pp.1175)
  • 29
    Precisão e eficiência relativa de métodos de amostragem em teca
    Miranda, Dirceu Lucio Carneiro; Francio, Jonas; Santos, Juliano De Paula; Sanquetta, Carlos Roberto; Corte, Ana Paula Dalla; ; (Pesquisa florestal brasileira, v.35, 2015, pp.247)
  • 30
    Early-onset Absence Epilepsy and Paroxysmal Dyskinesia
    Guerrini, Renzo; Sanchez-Carpintero, Rocio; Deonna, Thierry; Santucci, Margherita; Bhatia, Kailash P.; Moreno, Teresa; Parmeggiani, Lucio; Bernardina, Bernardo Dalla; ; (Epilepsia : the journal of the International League against Epilepsy, v.43, 2002, pp.1224-1229)
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