검색어 : 통합검색[Digital integrated circuits.]
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131
- Embedded Tutorial: Design Methodologies for Noise in Digital Integrated Circuits
- Shepard, K. L.; ; (ACM/IEEE Design Automation Conference. Proceedings, v.35, 1998, pp.94-99)
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132
- A hardware digital fuzzy inference engine using standard integrated circuits
- Shah, S.M.; Horvath, R.; ; (Information sciences, applications, v.1, 1994, pp.1-7)
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133
- Creation of integrated circuits based on basic matrix crystals for the purpose of import substitution of programmable logic integrated circuits from the onboard special digital complex
- Slavyansky, A.O.; Beskaravayny, V.A.; Latyshev, A.E.; ; (Radiotekhnika, v.10, 2023, )
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134
- Research progress on Strategy and Techniques of Fault Testing on Digital Integrated Circuits
- Yu, Yunhua; Shi, Yin; Insittue of Semiconudtors,Chiense Academy of Sciences; Insittue of Semiconudtors,Chiense Academy of Sciences; (電路與系統學報 = Journal of circuits and systems, v.9, 2004, pp.83-91)
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135
- Evaluation performance of digital integrated circuits while exposed to radiation
- Barbashov, V M; Trushkin, N S; ; (IOP conference series. Materials science and engineering, v.151, 2016, pp.012011)
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136
- Novel Full TMR Placement Techniques for High-Speed Radiation Tolerant Digital Integrated Circuits
- Appels, Karel; Prinzie, Jeffrey; Deptartment of Electrical Engineering (ESAT), KU Leuven, 3000 Leuven, Belgium; Deptartment of Electrical Engineering (ESAT), KU Leuven, 3000 Leuven, Belgium; (Electronics, v.9, 2020, pp.1936)
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137
- A Macromodeling Approach for Analog Behavior of Digital Integrated Circuits
- Mirzaie, Nahid; Rohrer, Ron; Department of Electrical and Computer Engineering, Southern Methodist University, Dallas, TX, USA; Department of Electrical and Computer Engineering, Southern Methodist University, Dallas, TX, USA; (IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society, v.39, 2020, pp.5025-5031)
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138
- High Temperature Digital and Analogue Integrated Circuits in Silicon Carbide
- Young, R.A.R.; Clark, David T.; Cormack, Jennifer D.; Murphy, A.E.; Smith, Dave A.; Thompson, Robin. F.; Ramsay, Ewan P.; Finney, S.; Raytheon UK; Raytheon UK; Raytheon UK; Raytheon UK; Raytheon UK; Raytheon UK; Raytheon UK; University of Strathclyde; (Materials science forum, v.740, 2013, pp.1065-1068)
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139
- Investigation on BIST assisted failure analysis on digital integrated circuits
- Hartmann, C.; Wieberneit, M.; Corresponding author. Tel.: +49 211 6503 1846; fax: +49 211 6503 1474.; Renesas Electronics Europe, European Quality Centre, Arcadiastraße 10, 40472 Dü sselorf, Germany; (Microelectronics reliability, v.50, 2010, pp.1464-1468)
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140
- A survey on fault injection methods of digital integrated circuits
- Eslami, Mohammad; Ghavami, Behnam; Raji, Mohsen; Mahani, Ali; Department of Engineering, Shahid Bahonar University of Kerman; Department of Engineering, Shahid Bahonar University of Kerman; School of Electrical and Computer Engineering, Shiraz University; Department of Engineering, Shahid Bahonar University of Kerman; (Integration, the VLSI journal, v.71, 2020, pp.154-163)
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